Dr. Friedrich S. Strohkendl
Research Associate at Raytheon
SPIE Involvement:
Author
Publications (6)

Proceedings Article | 21 February 2007 Paper
Yuri Zakharenkov, Todd Clatterbuck, Vladimir Shkunov, A. Betin, Dave Filgas, Eric Ostby, Friedrich Strohkendl, D. Rockwell, Rob Baltimore
Proceedings Volume 6454, 64540F (2007) https://doi.org/10.1117/12.701419
KEYWORDS: Optical amplifiers, Phase conjugation, Amplifiers, Oscillators, Mirrors, Solid state lasers, Holograms, Laser systems engineering, Laser applications, Continuous wave operation

Proceedings Article | 12 October 1998 Paper
Paul Fleitz, Mark Brant, Richard Sutherland, Friedrich Strohkendl, R. Larsen, Larry Dalton
Proceedings Volume 3472, (1998) https://doi.org/10.1117/12.326876
KEYWORDS: Absorption, Optical limiting, Nonlinear optics, Femtosecond phenomena, Molecules, Collimation, Optical testing, Dye lasers, Laser energy, Nd:YAG lasers

Proceedings Article | 1 November 1997 Paper
Proceedings Volume 3142, (1997) https://doi.org/10.1117/12.293358
KEYWORDS: Absorption, Photons, Thin films, Spectroscopy, Third-harmonic generation, Four wave mixing, Femtosecond phenomena, Polarization density, Fullerenes, Nonlinear optics

Proceedings Article | 16 December 1996 Paper
Proceedings Volume 2854, (1996) https://doi.org/10.1117/12.262990
KEYWORDS: Thin films, Phase measurement, Data modeling, Femtosecond phenomena, Four wave mixing, Optical amplifiers, Polarization, Silica, Amplifiers, Fullerenes

Proceedings Article | 8 December 1995 Paper
Friedrich Strohkendl, R. Larsen, Theresa Axenson, Larry Dalton, Robert Hellwarth, H. Sarkas, Zakya Kafafi
Proceedings Volume 2530, (1995) https://doi.org/10.1117/12.228116
KEYWORDS: Thin films, Silica, Polarization, Phase measurement, Dielectric polarization, Detection theory, Fullerenes, Molecules, Nonlinear optics, Refractive index

Showing 5 of 6 publications
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