Geng-Yen Lee
M.S. Student at National Central Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 16 February 2009 Paper
Proceedings Volume 7216, 72162P (2009) https://doi.org/10.1117/12.810165
KEYWORDS: Annealing, Surface roughness, Heterojunctions, Chromium, Molybdenum, Resistance, Aluminum, Nickel, Gallium nitride, Scanning electron microscopy

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