Dr. Yung-Ling Lan
M.S. student at Microwave & Optoelec. Devices Lab at National Central Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 16 February 2009 Paper
Proceedings Volume 7216, 72162P (2009) https://doi.org/10.1117/12.810165
KEYWORDS: Annealing, Surface roughness, Heterojunctions, Chromium, Molybdenum, Resistance, Aluminum, Nickel, Gallium nitride, Scanning electron microscopy

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top