Dr. Helia Hooshmand-Ziafi
at Univ of Nottingham
SPIE Involvement:
Conference Program Committee | Author
Publications (6)

SPIE Journal Paper | 12 April 2024 Open Access
OE, Vol. 63, Issue 04, 044102, (April 2024) https://doi.org/10.1117/12.10.1117/1.OE.63.4.044102
KEYWORDS: 3D modeling, Optical surfaces, Instrument modeling, Modeling, Equipment, Light sources and illumination, Optical engineering, Interferometry, Imaging systems, 3D metrology

Proceedings Article | 10 August 2023 Presentation + Paper
Proceedings Volume 12619, 126190R (2023) https://doi.org/10.1117/12.2673657
KEYWORDS: 3D modeling, Optical surfaces, Modeling, Equipment, Instrument modeling, Light sources and illumination, Interferometry, Imaging systems, Fourier transforms

SPIE Journal Paper | 31 December 2022
OE, Vol. 61, Issue 12, 124113, (December 2022) https://doi.org/10.1117/12.10.1117/1.OE.61.12.124113
KEYWORDS: Light scattering, Optical surfaces, Scattering, 3D modeling, Optical engineering, Multiple scattering, Modeling, Data modeling, Polarization, Confocal microscopy

Proceedings Article | 3 October 2022 Paper
Proceedings Volume 12221, 122210W (2022) https://doi.org/10.1117/12.2639003
KEYWORDS: Scattering, Light scattering, Multiple scattering, Modeling, Data modeling, 3D modeling, Polarization, Microscopy, 3D metrology

SPIE Journal Paper | 15 November 2019
OE, Vol. 58, Issue 11, 114104, (November 2019) https://doi.org/10.1117/12.10.1117/1.OE.58.11.114104
KEYWORDS: Shearography, Sensors, Phase shifts, Speckle, Aluminum, Interferometry, Wavefronts, Phase shifting, Imaging systems, Fourier transforms

Showing 5 of 6 publications
Conference Committee Involvement (1)
Optics and Photonics for Advanced Dimensional Metrology III
9 April 2024 | Strasbourg, France
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