Mr. Jacek Kacperski Profile

Jacek Kacperski

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Author

Publications (13)

Proceedings Article | 25 April 2008 Paper

Benchmarking instrumentation tools for the characterization of microlenses within the EC Network of Excellence on Micro-Optics (NEMO)

H. Ottevaere, J. Schwider, J. Kacperski, L. Steinbock, K. Weible, M. Kujawinska, H. Thienpont

Proceedings Volume 6995, 69950J (2008) https://doi.org/10.1117/12.783514

KEYWORDS: Microlens, Spherical lenses, Source mask optimization, Micro optics, Surface roughness, Beam splitters, Microscopes, Interferometers, Microlens array, Optical fibers

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Proceedings Article | 18 June 2007 Paper

Phase only SLM as a reference element in Twyman-Green laser interferometer for MEMS measurement

Jacek Kacperski, Malgorzata Kujawinska

Proceedings Volume 6616, 66163E (2007) https://doi.org/10.1117/12.726214

KEYWORDS: Spatial light modulators, Liquid crystal on silicon, Interferometers, Wavefronts, Phase shifts, Interferometry, Chemical elements, Microelectromechanical systems, Liquid crystals, Reflectivity

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Proceedings Article | 28 April 2006 Paper

Optical characterization of spherical microlenses: a round robin experiment within the EC Network of Excellence on Micro-Optics (NEMO)

Heidi Ottevaere, Johannes Schwider, Jürgen Lamprecht, Jacek Kacperski, Anna Szpak, Lothar Steinbock, Ken Weible, Hugo Thienpont

Proceedings Volume 6188, 618818 (2006) https://doi.org/10.1117/12.663597

KEYWORDS: Microlens, Source mask optimization, Spherical lenses, Micro optics, Beam splitters, Interferometers, Surface roughness, Microscopes, Microlens array, Optical fibers

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Proceedings Article | 28 April 2006 Paper

LCOS as a reference element in Twyman-Green laser interferometer

Jacek Kacperski, Malgorzata Kujawinska, Michal Jozwik

Proceedings Volume 6188, 61881C (2006) https://doi.org/10.1117/12.663389

KEYWORDS: Liquid crystal on silicon, Interferometers, Wavefronts, Mirrors, Interferometry, Phase shifts, Spatial light modulators, Ferroelectric materials, Calibration, Silicon

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Proceedings Article | 12 October 2005 Paper

Dynamic measurements of actuators driven by AlN layers

Jacek Kacperski, Malgorzata Kujawinska, Sergio Camacho Leon, Lukasz Nieradko, Michal Jozwik, Christophe Gorecki

Proceedings Volume 5958, 59580J (2005) https://doi.org/10.1117/12.622853

KEYWORDS: Liquid crystal on silicon, Interferometry, Finite element methods, Actuators, Aluminum nitride, Interferometers, Beam shaping, Phase shifts, Electrodes, Microelectromechanical systems

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Proceedings Article | 1 September 2005 Paper

Multifunctional interferometric platform for static and dynamic MEMS measurement

Jacek Kacperski, Malgorzata Kujawinska

Proceedings Volume 5878, 587807 (2005) https://doi.org/10.1117/12.616840

KEYWORDS: Liquid crystal on silicon, Interferometry, Interferometers, Wavefronts, Reflectivity, Mirrors, Phase shifts, Microelectromechanical systems, Diffusers, Beam expanders

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Proceedings Article | 13 June 2005 Paper

Time synchronization of oscillating objects with laser pulse in pulse interferometry

Jaroslaw Bartold, Jacek Kacperski, Leszek Salbut

Proceedings Volume 5856, (2005) https://doi.org/10.1117/12.612581

KEYWORDS: Pulsed laser operation, Interferometry, Cameras, Laser interferometry, Silicon, Shape analysis, Profiling, Signal attenuation, Motion measurement, Power supplies

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Proceedings Article | 8 September 2004 Paper

Conventional and fiber optics interferometry for vibration mode analysis

Krzysztof Patorski, Artur Olszak, Leszek Salbut, Agata Jozwicka, Jacek Kacperski, Michal Jozwik, Anna Sliwa

Proceedings Volume 5576, (2004) https://doi.org/10.1117/12.581775

KEYWORDS: Interferometry, Fiber optics, Phase shift keying, Semiconductor lasers, Modulation, Ferroelectric materials, Bessel functions, Speckle pattern, Heterodyning, Interferometers

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Proceedings Article | 17 August 2004 Paper

Modified linear and circular carrier-frequency Fourier-transform method applied for studies of vibrating microelements

Jacek Kacperski, Malgorzata Kujawinska, Jerzy Krezel

Proceedings Volume 5458, (2004) https://doi.org/10.1117/12.554287

KEYWORDS: Fourier transforms, Error analysis, Interferometry, Fringe analysis, Spherical lenses, Phase shifting, Ferroelectric materials, Spatial frequencies, Diffraction, Electrodes

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Proceedings Article | 17 August 2004 Paper

Interferometric methods for static and dynamic characterizations of micromembranes for sensing functions

Leszek Salbut, Jacek Kacperski, Adam Styk, Michal Jozwik, Christophe Gorecki, Hakan Urey, Alain Jacobelli, Thierry Dean

Proceedings Volume 5458, (2004) https://doi.org/10.1117/12.545574

KEYWORDS: Interferometry, Semiconducting wafers, Manufacturing, Silicon, Electrodes, Phase interferometry, Shape analysis, Ferroelectric materials, Bessel functions, Statistical analysis

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Proceedings Article | 2 August 2004 Paper

Active microinterferometer with liquid crystal on silicon (LCOS) for extended range static and dynamic micromembrane measurement

Jacek Kacperski, Malgorzata Kujawinska, Xinghua Wang, Philip Bos

Proceedings Volume 5532, (2004) https://doi.org/10.1117/12.560904

KEYWORDS: Liquid crystal on silicon, Interferometers, Phase shifts, Interferometry, Mirrors, Wavefronts, Chemical elements, Ferroelectric materials, Liquid crystals, Calibration

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Proceedings Article | 24 October 2003 Paper

Automated system for interferometric out-of-plane and in-plane microelements measurement

Jacek Kacperski, Tomasz Sykula, Malgorzata Kujawinska, Leszek Salbut

Proceedings Volume 5125, (2003) https://doi.org/10.1117/12.531537

KEYWORDS: Interferometers, Interferometry, Diffraction gratings, Waveguides, Silicon, Computing systems, Beam splitters, Moire patterns, Sensors, Reflection

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Proceedings Article | 3 October 2003 Paper

Active microelement testing by interferometry using time-average and quasi-stroboscopic techniques

Leszek Salbut, Krzysztof Patorski, Michal Jozwik, Jacek Kacperski, Christophe Gorecki, Alain Jacobelli, Thierry Dean

Proceedings Volume 5145, (2003) https://doi.org/10.1117/12.500747

KEYWORDS: Interferometry, Bessel functions, Visualization, Ferroelectric materials, Modulation, Electrodes, Calibration, Digital holography, Spatial resolution, Optical testing

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Showing 5 of 13 publications

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