Dr. Jeffry J. Sniegowski
VP Production at Sandia National Labs
SPIE Involvement:
Author
Publications (22)

Proceedings Article | 20 October 2004 Paper
Jeffry Sniegowski, Steven Rodgers, Bradley Boone, Jonathan Bruzzi, Chris Drabenstadt, Bernard Kluga, Eric Rogala, Robert Osiander, Keith Rebello, Margaret Darrin
Proceedings Volume 5550, (2004) https://doi.org/10.1117/12.562819
KEYWORDS: Micromirrors, Mirrors, Microelectromechanical systems, Oxides, Digital signal processing, Transmitters, Space operations, CMOS cameras, Charge-coupled devices, Imaging systems

SPIE Journal Paper | 1 October 2003 Open Access
Jeffry Sniegowski, James Smith
JM3, Vol. 2, Issue 04, (October 2003) https://doi.org/10.1117/12.10.1117/1.1616574

Proceedings Article | 30 August 1999 Paper
Siv Limary, Harold Stewart, Lloyd Irwin, John McBrayer, Jeffry Sniegowski, Stephen Montague, James Smith, Maarten de Boer, Jerome Jakubczak
Proceedings Volume 3874, (1999) https://doi.org/10.1117/12.361210
KEYWORDS: Resistance, Semiconducting wafers, Oxides, Microelectromechanical systems, Etching, Silicon, Scanning electron microscopy, Diagnostics, Computer aided design, Standards development

Proceedings Article | 30 August 1999 Paper
Sita Mani, James Fleming, Jeffry Sniegowski
Proceedings Volume 3874, (1999) https://doi.org/10.1117/12.361215
KEYWORDS: Tungsten, Silicon, Microelectromechanical systems, Coating, Resonators, Oxides, Semiconducting wafers, Photomicroscopy, Chemical vapor deposition, Deposition processes

Proceedings Article | 13 October 1998 Paper
Dale Hetherington, Jeffry Sniegowski
Proceedings Volume 3440, (1998) https://doi.org/10.1117/12.326692
KEYWORDS: Chemical mechanical planarization, Oxides, Micromirrors, Mirrors, Surface finishing, Adaptive optics, Polishing, Photography, Profilometers, Chemical elements

Showing 5 of 22 publications
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top