Dr. John P. Kerekes
Research Professor at Rochester Institute of Technology
SPIE Involvement:
Author
Area of Expertise:
Remote sensing , Hyperspectral imaging , System modeling , Pattern recognition
Websites:
Profile Summary

Dr. Kerekes has worked throughout his career on advancing the state of the art and practice of remote sensing technology through theoretical investigations, data analyses, and modeling of remote sensing systems. His interest has been in viewing the end-to-end remote sensing process as a system with application performance as the system metric. Developing models with this perspective has improved understanding of parameter sensitivities and requirements for system design and operation. His work has emphasized the use of statistical parametric models in propagating the information bearing characteristics of the scene through the effects of the remote sensing process. He has applied this approach to the study of multispectral remote sensing systems designed for surface land cover classification, the vertical profiling of atmospheric temperature and water vapor, and for unresolved (sub-pixel) object detection and identification. He has also investigated the use of spectral imaging for medical applications.

The field of remote sensing is multi-disciplinary by nature and Dr. Kerekes has developed, through professional interactions and study, a broad understanding and appreciation of the application side of remote sensing systems. This perspective has Dr. Kerekes well positioned to continue to contribute to collaborative research efforts that apply electrical engineering and remote sensing technologies to increasingly critical areas such as homeland security, site specific farm management, climate monitoring, resource monitoring, urban growth, and sustainable development. He also has interests in applying these concepts to the development and use of other multidimensional imaging systems such as those used for biomedical laboratory and industrial manufacturing applications.
Publications (66)

Proceedings Article | 30 September 2022 Presentation + Paper
Proceedings Volume 12235, 122350J (2022) https://doi.org/10.1117/12.2633165
KEYWORDS: Methane, Reflectivity, Sensors, Long wavelength infrared, Short wave infrared radiation, Infrared sensors, Image filtering, Infrared radiation, Infrared detectors, Signal to noise ratio

Proceedings Article | 30 September 2022 Presentation + Paper
Proceedings Volume 12235, 122350E (2022) https://doi.org/10.1117/12.2633609
KEYWORDS: Target detection, Systems modeling, Atmospheric modeling, Data modeling, Sensors, Imaging systems, Signal to noise ratio, Hyperspectral target detection, Hyperspectral systems, Bidirectional reflectance transmission function

SPIE Journal Paper | 7 September 2020 Open Access
OE, Vol. 59, Issue 09, 092012, (September 2020) https://doi.org/10.1117/12.10.1117/1.OE.59.9.092012
KEYWORDS: Data modeling, Particles, Scanning tunneling microscopy, Mie scattering, Reflectivity, Spectroscopy, Solids, Thin films, Statistical modeling, Optical engineering

Proceedings Article | 17 September 2018 Paper
Proceedings Volume 10743, 1074304 (2018) https://doi.org/10.1117/12.2320641
KEYWORDS: Stray light, Point spread functions, Systems modeling, Imaging systems, Data modeling, Telescopes, Earth observing sensors, Landsat, Performance modeling, Remote sensing

Proceedings Article | 25 May 2018 Presentation + Paper
Proceedings Volume 10644, 1064411 (2018) https://doi.org/10.1117/12.2305221
KEYWORDS: Satellite imaging, Satellites, Earth observing sensors, Computer simulations, Detection and tracking algorithms, Principal component analysis, Signal to noise ratio, Image registration, Human-machine interfaces, Image segmentation

Showing 5 of 66 publications
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top