Kun-Hong Chen
at National Yunlin Univ of Science and Technology
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 8 December 2022 Paper
Proceedings Volume 12480, 1248009 (2022) https://doi.org/10.1117/12.2660162
KEYWORDS: Finite element methods, Multilayers, Refractive index, Stress analysis, Zirconium dioxide, Thin films, Positron emission tomography, Oxygen, Transmittance, Phase shifts

Proceedings Article | 27 October 2021 Paper
Kun-Hong Chen, Hsi-Chao Chen, Sheng-Bin Chen, Guan Chen, Tsung Wu, Kuo Kai
Proceedings Volume 11927, 119270P (2021) https://doi.org/10.1117/12.2616275
KEYWORDS: Tantalum, Multilayers, Refractive index, Positron emission tomography, Oxygen, Silica, Ion beams, Antireflective coatings, Optical properties, Deflectometry

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