Prof. Michael W. Kudenov
Associate Professor at North Carolina State Univ
SPIE Involvement:
Conference Program Committee | Author | Instructor | Student Chapter Advisor
Area of Expertise:
Polarimetry , Spectroscopy , Infrared Imaging , Remote Sensing , Phenotyping , Machine Learning
Websites:
Profile Summary

Dr. Kudenov obtained his BS in Electrical Engineering from the University of Alaska Fairbanks in 2005 and his PhD in Optical Sciences from the University of Arizona in 2009. He is currently an Associate Professor in Electrical and Computer Engineering at North Carolina State University. His research interests focus on imaging spectrometer and polarimeter sensors for applications spanning agriculture, plant phenotyping, remote sensing, and quality control. He also serves as the academic advisor for the NC State SPIE student chapter.
Publications (66)

Proceedings Article | 5 October 2023 Presentation
Proceedings Volume PC12690, PC126900A (2023) https://doi.org/10.1117/12.2676359
KEYWORDS: Spectropolarimetry, Mueller matrices, Biological imaging, Polarimetry, Visible radiation, Time metrology, Simulations, Signal to noise ratio, Reflectivity, Portability

Proceedings Article | 5 October 2023 Presentation
Danny Krafft, Grant Scarboro, Peter Balint-Kurti, Colleen Doherty, Michael Kudenov
Proceedings Volume PC12690, PC126900E (2023) https://doi.org/10.1117/12.2676358
KEYWORDS: Polarimetry, Hyperspectral imaging, Data modeling, Bidirectional reflectance transmission function, Polarization, Cameras, Agriculture, Yield improvement, Systems modeling, Sensors

Proceedings Article | 13 June 2023 Presentation
Danny Krafft, Grant Scarboro, Peter Balint-Kurti, Colleen Doherty, Michael Kudenov
Proceedings Volume PC12539, PC1253908 (2023) https://doi.org/10.1117/12.2665181
KEYWORDS: Polarimetry, Hyperspectral imaging, Polarization, Cameras, Light scattering, Data modeling, Bidirectional reflectance transmission function, Yield improvement, Vegetation, Tissues

SPIE Journal Paper | 21 July 2022
Ali Altaqui, Harry Schrickx, Sydney Gyurek, Pratik Sen, Michael Escuti, Brendan O'Connor, Michael Kudenov
OE, Vol. 61, Issue 07, 077104, (July 2022) https://doi.org/10.1117/12.10.1117/1.OE.61.7.077104
KEYWORDS: Sensors, Diffraction, Multispectral imaging, Optical engineering, Point spread functions, Eye, Polarization, Optical filters, Multispectral sensing, Chromatic aberrations

Proceedings Article | 3 June 2022 Presentation + Paper
Proceedings Volume 12112, 121120G (2022) https://doi.org/10.1117/12.2623073
KEYWORDS: Polarization, Cameras, Sensors, Global Positioning System, Multispectral imaging, Imaging systems, Image processing, Linear polarizers, Clouds, Optical inspection

Showing 5 of 66 publications
Conference Committee Involvement (18)
Polarization: Measurement, Analysis, and Remote Sensing XVI
22 April 2024 | National Harbor, Maryland, United States
Polarization Science and Remote Sensing XI
21 August 2023 | San Diego, California, United States
Polarization: Measurement, Analysis, and Remote Sensing XV
4 April 2022 | Orlando, Florida, United States
Polarization Science and Remote Sensing X
1 August 2021 | San Diego, California, United States
Polarization: Measurement, Analysis, and Remote Sensing XIV
27 April 2020 | Online Only, California, United States
Showing 5 of 18 Conference Committees
Course Instructor
SC180: Imaging Polarimetry
This course covers imaging polarimeters from an instrumentation-design point of view. Basic polarization elements for the visible, mid-wave infrared, and long-wave infrared are described in terms of Mueller matrices and the Poincaré sphere. Polarization parameters such as the degree of polarization (DOP), the degree of linear polarization (DOLP) and the degree of circular polarization (DOCP) are explained in an imaging context. Emphasis is on imaging systems designed to detect polarized light in a 2-D image format. System concepts are discussed using a Stokes-parameter (s0,s1,s2,s3) image. Imaging-polarimeter systems design, pixel registration, and signal to noise ratios are explored. Temporal artifacts, characterization and calibration techniques are defined.
SC1331: Embedded Optical Systems
Use-inspired research and product development, along with machine learning, is becoming well-established in our community. Collecting image and sensor data, within the environments in which a classification or detection software will be deployed, is paramount for training and developing algorithms. This course provides a starting point for deploying embedded optical systems for moderate-scale data collection projects and edge (machine learning/AI) computing applications. Bit depth, image formation, sampling artifacts, camera responsivity, and practical issues related to radiometric transfer are placed into the context of camera selection, computer networking, embedded system compute power, GPIO, cable fabrication, electronic shielding, sensor ruggedization, operating systems, camera software development kits, and programming interfaces. Examples focus on high throughput optical plant phenotyping sensors, deployed in on-line commercial packing operations, to further describe the impact that proper selection of electronics, shielding, and compute methods can have in real-world environments. Key questions answered include “How do I synchronize image collection to external events?” and “How does camera and lens selection impact my data quality?”
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