Xiuhong Wei
at Technische Univ Delft
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 12 May 2005 Paper
Proceedings Volume 5754, (2005) https://doi.org/10.1117/12.597438
KEYWORDS: Diffraction, Photomasks, Polarization, Chromium, Binary data, Semiconducting wafers, Critical dimension metrology, Reticles, Optical proximity correction, Near field

Proceedings Article | 12 May 2005 Paper
Xiuhong Wei, H. Urbach, Arthur Wachters, Yuri Aksenov
Proceedings Volume 5754, (2005) https://doi.org/10.1117/12.597732
KEYWORDS: Chromium, Photomasks, 3D modeling, Polarization, Binary data, Dielectric polarization, Finite element methods, Magnetism, Mathematical modeling, Maxwell's equations

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