Dr. Bozenko F. Oreb Profile

Dr. Bozenko F. Oreb

Senior Research Scientist at CSIRO

SPIE Involvement:

Author

Publications (32)

SPIE Journal Paper | 1 February 2011

Chemical bonding for precision optical assemblies

Katie Green, Jan Burke, Bozenko Oreb

OE, Vol. 50, Issue 02, 023401, (February 2011) https://doi.org/10.1117/12.10.1117/1.3533034

KEYWORDS: Zerodur, Silicates, Glasses, Optical fabrication, Bioalcohols, Interfaces, Silica, Ozone, Optical engineering, Distortion

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Proceedings Article | 11 August 2008 Paper

Fabrication and testing of a high-precision concave spherical mirror

Jan Burke, Katie Green, Wayne Stuart, Edita Puhanic, Achim Leistner, Bob Oreb

Proceedings Volume 7064, 70640E (2008) https://doi.org/10.1117/12.793522

KEYWORDS: Optical spheres, Mirrors, Calibration, Spherical lenses, Phase shifts, Polishing, Wavefronts, Error analysis, Photovoltaics, Interferometers

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Proceedings Article | 28 July 2008 Paper

Certification of the full size double corner cube fiducials for the Space Interferometer Mission-PlanetQuest test bed

Jan Burke, Katie Green, Nasrat Raouf, Jeffrey Seckold, Bob Oreb

Proceedings Volume 7013, 701351 (2008) https://doi.org/10.1117/12.790531

KEYWORDS: Reflectivity, Platinum, Photovoltaics, Interferometers, Optical fabrication, Glasses, Radium, Metrology, Microscopes, Retroreflectors

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Proceedings Article | 14 August 2006 Paper

Development of precision double corner cubes for the Space Interferometer Mission

Bozenko Oreb, Jan Burke, Roger Netterfield, Jeffrey Seckold, Achim Leistner, Mark Gross, Svetlana Dligatch

Proceedings Volume 6292, 629202 (2006) https://doi.org/10.1117/12.680094

KEYWORDS: Coating, Gold, Interferometers, Prisms, Polishing, Fabry–Perot interferometers, Metrology, Wavefronts, Microscopes, Zerodur

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Proceedings Article | 9 December 2005 Paper

Measurement of optical thickness variation of a multiple-surface object by a wavelength tuning interferometer

Jan Burke, Kenichi Hibino, Ryohei Hanayama, Bonzenko Oreb

Proceedings Volume 6024, 60240O (2005) https://doi.org/10.1117/12.666830

KEYWORDS: Semiconducting wafers, Wafer-level optics, Wavelength tuning, Optical testing, Interferometers, Reflection, Interferometry, Lithium niobate, Glasses, Silica

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Proceedings Article | 20 October 2005 Paper

Manufacturing and testing of precision optical components - from substrate to coating and assembling

Roger Netterfield, Bozenko Oreb, Achim Leistner, Katie Green, Jeff Seckold, Mark Gross

Proceedings Volume 5965, 59650H (2005) https://doi.org/10.1117/12.625539

KEYWORDS: Surface finishing, Coating, Mirrors, Polishing, Prisms, Distortion, Optical components, Particles, Interferometers, Metrology

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Proceedings Article | 19 August 2005 Paper

Precision metrology of dihedral angle error in prisms and corner cubes for the Space Interferometry Mission

Jan Burke, Bozenko Oreb, Benjamin Platt, Bijan Nemati

Proceedings Volume 5869, 58690W (2005) https://doi.org/10.1117/12.613591

KEYWORDS: Prisms, Wavefronts, Fringe analysis, Interferometers, Mirrors, Interferometry, Error analysis, Phase shifts, Retroreflectors, Collimation

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Proceedings Article | 2 August 2004 Paper

Interferometric measurement of a multiparallel-surface transparent object by a new class of wavelength tuning algorithms

Kenichi Hibino, Jan Burke, Ryohei Hanayama, Bozenko Oreb

Proceedings Volume 5531, (2004) https://doi.org/10.1117/12.555804

KEYWORDS: Signal detection, Interferometry, Phase shifts, Glasses, Modulation, Refractive index, Phase measurement, Algorithm development, Detection and tracking algorithms, Interference (communication)

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Proceedings Article | 22 December 2003 Paper

Measurement of surface figure and optical thickness variation of a thin parallel plate in wavelength-scanned interferometry with minimized laser tuning range

Kenichi Hibino, Jan Burke, Bozenko Oreb

Proceedings Volume 5180, (2003) https://doi.org/10.1117/12.503439

KEYWORDS: Phase shifts, Refractive index, Wavelength tuning, Signal detection, Photovoltaics, Fizeau interferometers, Interferometers, Interferometry, Detection and tracking algorithms, Algorithm development

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Proceedings Article | 19 November 2003 Paper

Refractive index inhomogeneity measurement of a parallel plate in a Fizeau interferometer by a new wavelength scanning algorithm

Kenichi Hibino, Bozenko Oreb, Philip Fairman

Proceedings Volume 4829, (2003) https://doi.org/10.1117/12.530070

KEYWORDS: Refractive index, Fizeau interferometers, Interferometry, Optical testing, Interferometers, Absorbance, Phase measurement, Glasses, Sapphire, Surface finishing

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Proceedings Article | 20 June 2002 Paper

Improved algorithms for wavelength scanning interferometry: application to the simultaneous measurement of surface topography and optical thickness variation in a transparent parallel plate

Kenichi Hibino, Bozenko Oreb, Philip Fairman

Proceedings Volume 4777, (2002) https://doi.org/10.1117/12.472221

KEYWORDS: Interferometry, Dispersion, Signal detection, Modulation, Fizeau interferometers, Interferometers, Detection and tracking algorithms, Optical testing, Refractive index, Reflection

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SPIE Journal Paper | 1 February 2002

Stitching interferometric measurement data for inspection of large optical components

Mikael Sjoedahl, Bozenko Oreb

OE, Vol. 41, Issue 02, (February 2002) https://doi.org/10.1117/12.10.1117/1.1430727

KEYWORDS: Signal to noise ratio, Interferometers, Interferometry, Matrices, Inspection, Optical components, Optical inspection, Optical engineering, Digital filtering, Image processing

Proceedings Article | 27 December 2001 Paper

Interferometric measurement of refractive index inhomogeneity on polished sapphire substrates: application to LIGO-II

Bozenko Oreb, Achim Leistner, GariLynn Billingsley, William Kells, Jordan Camp

Proceedings Volume 4451, (2001) https://doi.org/10.1117/12.453639

KEYWORDS: Sapphire, Refractive index, Polishing, LIGO, Interferometers, Surface finishing, Wavefronts, Crystals, Polarization, Distortion

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Proceedings Article | 11 November 1999 Paper

Characterization of wavefront variations in coated optics

Bozenko Oreb, Roger Netterfield, Christopher Walsh, Christopher Freund, Achim Leistner, Jeffrey Seckold

Proceedings Volume 3782, (1999) https://doi.org/10.1117/12.369189

KEYWORDS: Wavefronts, Antireflective coatings, Monochromatic aberrations, Distortion, Optical coatings, LIGO, Interferometers, Reflectivity, Reflection, Nanoimprint lithography

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Proceedings Article | 11 November 1999 Paper

LIGO optics manufacture: figuring transmission core optics for best performance

Achim Leistner, David Farrant, Bozenko Oreb, Edita Pavlovic, Jeffrey Seckold, Christopher Walsh

Proceedings Volume 3782, (1999) https://doi.org/10.1117/12.369188

KEYWORDS: Polishing, Surface finishing, Wavefronts, Optics manufacturing, LIGO, Refractive index, Silicon, Interferometers, Zerodur, Beam splitters

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Proceedings Article | 11 November 1999 Paper

Manufacture of LIGO core optics at CSIRO

Christopher Walsh, Achim Leistner, Bozenko Oreb, Jeffrey Seckold, David Farrant, Ronald Bulla, Glenn Davis, Phillip Lennox, Frank Lesha, Edita Pavlovic, Wayne Stuart, Carl Sona, Ruimin Yin

Proceedings Volume 3782, (1999) https://doi.org/10.1117/12.369187

KEYWORDS: Polishing, Surface finishing, LIGO, Wavefronts, Tolerancing, Optics manufacturing, Silicon, Beam splitters, Monochromatic aberrations, Interferometers

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Proceedings Article | 7 September 1999 Paper

Coating requirements for the reference flat of a Fizeau interferometer used for measuring from uncoated to highly reflecting surfaces

Roger Netterfield, David Drage, Christopher Freund, Christopher Walsh, Achim Leistner, Jeffrey Seckold, Bozenko Oreb

Proceedings Volume 3738, (1999) https://doi.org/10.1117/12.360073

KEYWORDS: Coating, Fizeau interferometers, Reflectivity, Reflection, Critical dimension metrology, Fringe analysis, Surface finishing, LIGO, Interfaces, Silica

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Proceedings Article | 17 August 1999 Paper

Fabrication and metrology of km-scale radii on surfaces of master tooling

Achim Leistner, Bozenko Oreb, Jeffrey Seckold, Christopher Walsh

Proceedings Volume 3745, (1999) https://doi.org/10.1117/12.357762

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Proceedings Article | 17 August 1999 Paper

Metrology of transmission optics for LIGO

Christopher Walsh, Achim Leistner, Bozenko Oreb, Jeffrey Seckold, David Farrant, Edita Pavlovic

Proceedings Volume 3745, (1999) https://doi.org/10.1117/12.357795

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Proceedings Article | 13 August 1999 Paper

Combined deformation and shape measurement with ESPI

David Farrant, Jon Petzing, John Tyrer, Bozenko Oreb

Proceedings Volume 3744, (1999) https://doi.org/10.1117/12.357749

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Proceedings Article | 13 August 1999 Paper

Metrology of LIGO core optics

Bozenko Oreb, David Farrant, Christopher Walsh, Achim Leistner, Frank Lesha, Philip Fairman, Carl Sona

Proceedings Volume 3744, (1999) https://doi.org/10.1117/12.357716

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SPIE Journal Paper | 1 August 1999

300-mm-aperture phase-shifting Fizeau interferometer

Philip Fairman, B. Ward, Bozenko Oreb, David Farrant, Yves Gilliand, Christopher Freund, Achim Leistner, Jeffrey Seckold, Christopher Walsh

OE, Vol. 38, Issue 08, (August 1999) https://doi.org/10.1117/12.10.1117/1.602180

KEYWORDS: Phase shifts, Nanoimprint lithography, Optical testing, Monochromatic aberrations, Wavefronts, Fizeau interferometers, Semiconductor lasers, Sensors, Beam splitters, Foam

Proceedings Article | 19 July 1999 Paper

Precision optics for long baseline interferometry

Achim Leistner, Bozenko Oreb, Christopher Walsh

Proceedings Volume 3749, (1999) https://doi.org/10.1117/12.355070

KEYWORDS: Interferometers, LIGO, Surface finishing, Wavefronts, Beam splitters, Interferometry, Optics manufacturing, Polishing, Precision optics, Tolerancing

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Proceedings Article | 12 December 1997 Paper

Transient deformation measurement using dual-pulse addition ESPI

David Farrant, Guillermo Kaufmann, Jon Petzing, John Tyrer, Bozenko Oreb, David Kerr

Proceedings Volume 3173, (1997) https://doi.org/10.1117/12.294507

KEYWORDS: Bandpass filters, Speckle pattern, Interferometry, Imaging systems, Nd:YAG lasers, Cameras, Laser development, Quantitative analysis, Mirrors, Fourier transforms

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Proceedings Article | 1 November 1997 Paper

Metrology of LIGO Pathfinder optics

David Farrant, Achim Leistner, Bozenko Oreb, Mark Suchting, Christopher Walsh

Proceedings Volume 3134, (1997) https://doi.org/10.1117/12.279140

KEYWORDS: Monochromatic aberrations, Interferometers, Spatial frequencies, LIGO, Metrology, Optical testing, Manufacturing, Phase measurement, Calibration, Surface finishing

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Proceedings Article | 20 March 1997 Paper

Current experimental techniques for high-temperature displacement/strain evaluation: an outline of available techniques

K. Zarrabi, Bozenko Oreb

Proceedings Volume 2921, (1997) https://doi.org/10.1117/12.269822

KEYWORDS: Speckle, Temperature metrology, Speckle pattern, Resistance, Capacitance, LCDs, Optical fibers, Manufacturing, Moire patterns, Numerical analysis

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Proceedings Article | 14 June 1995 Paper

Simultaneous measurements of vector components of displacement by ESPI and FFT techniques

Toshiyuki Takatsuji, Bozenko Oreb, David Farrant, Philip Fairman

Proceedings Volume 2544, (1995) https://doi.org/10.1117/12.211870

KEYWORDS: Speckle, Fourier transforms, Modulation, Speckle pattern, Interferometry, Light scattering, Image processing, Electronic components, Image filtering, Cameras

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Proceedings Article | 23 July 1993 Paper

Contouring the shape of contact lenses by projected fringe profilometry

B. Oreb

Proceedings Volume 1983, 1983AJ (1993) https://doi.org/10.1117/12.2308798

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Proceedings Article | 5 February 1993 Paper

New seven-sample symmetrical phase-shifting algorithm

Kieran Larkin, Bozenko Oreb

Proceedings Volume 1755, (1993) https://doi.org/10.1117/12.140762

KEYWORDS: Phase shifts, Error analysis, Phase shifting, Algorithm development, Detection and tracking algorithms, Interferometry, Ions, Fourier transforms, Algorithms, Fourier theory

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Proceedings Article | 5 February 1993 Paper

Propagation of errors in different phase-shifting algorithms: a special property of the arctangent function

Kieran Larkin, Bozenko Oreb

Proceedings Volume 1755, (1993) https://doi.org/10.1117/12.140773

KEYWORDS: Error analysis, Phase shifts, Phase shifting, Interferometry, Detection and tracking algorithms, Sensors, Signal detection, Phase measurement, Aluminum, Modulation

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