Dr. Mathias Richter
at Physikalisch-Technische Bundesanstalt
SPIE Involvement:
Author
Publications (9)

Proceedings Article | 24 April 2019 Paper
Sanghoon Song, Roberto Alonso-Mori, Matthieu Chollet, Yiping Feng, James Glownia, Henrik Lemke, Marcin Sikorski, Diling Zhu, Stefan Moeller, Hae Ja Lee, Mark Hunter, Gabriella Carini, Kai Tiedtke, Ulf Jastrow, Andrey Sorokin, Mathias Richter, Shigeki Owada, Kensuke Tono, Norio Saito, Takahiro Tanaka, Masahiro Kato, Makina Yabashi, Aymeric Robert
Proceedings Volume 11038, 1103810 (2019) https://doi.org/10.1117/12.2520827
KEYWORDS: X-rays, Power meters, Hard x-rays, X-ray detectors, Diagnostics, Free electron lasers

SPIE Journal Paper | 23 November 2016
Roman Klein, Rolf Fliegauf, Simone Kroth, Wolfgang Paustian, Thomas Reichel, Mathias Richter, Reiner Thornagel
JATIS, Vol. 2, Issue 04, 044002, (November 2016) https://doi.org/10.1117/12.10.1117/1.JATIS.2.4.044002
KEYWORDS: Calibration, Aerospace engineering, Synchrotron radiation, Ultraviolet radiation, Vacuum ultraviolet, Space telescopes, Electron beams, Spectrographs, Spectroscopy, X-rays

Proceedings Article | 3 May 2013 Paper
Mathias Richter, Andrey Sorokin, Kai Tiedtke
Proceedings Volume 8778, 877808 (2013) https://doi.org/10.1117/12.2021298
KEYWORDS: Ionization, Free electron lasers, Ions, X-rays, Xenon, Chemical species, Extreme ultraviolet, Multiphoton processes, Spectroscopy, Mirrors

Proceedings Article | 16 May 2007 Paper
J. John, P. Malinowski, P. Aparicio, G. Hellings, A. Lorenz, M. Germain, F. Semond, J.-Y. Duboz, A. BenMoussa, J.-F. Hochedez, U. Kroth, M. Richter
Proceedings Volume 6585, 658505 (2007) https://doi.org/10.1117/12.723023
KEYWORDS: Aluminum, Sensors, Gallium, Extreme ultraviolet, Diodes, Staring arrays, Quantum efficiency, Ultraviolet radiation, Calibration, Imaging arrays

Proceedings Article | 24 March 2006 Paper
E. Louis, R. W .E. van de Kruijs, A. E. Yakshin, S. Alonso van der Westen, F. Bijkerk, M. M. J. W. van Herpen, D. J. W. Klunder, L. Bakker, H. Enkisch, S. Müllender, M. Richter, V. Banine
Proceedings Volume 6151, 615139 (2006) https://doi.org/10.1117/12.675132
KEYWORDS: Multilayers, Reflectivity, Extreme ultraviolet, EUV optics, Optical components, Extreme ultraviolet lithography, Mirrors, Silicon, Optical coatings, Vacuum ultraviolet

Showing 5 of 9 publications
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