Mr. Nakyoon Kim Profile

Nakyoon Kim

at KLA Corp

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Author

Publications (2)

Proceedings Article | 13 March 2018 Presentation + Paper

In-cell overlay metrology by using optical metrology tool

Honggoo Lee , Sangjun Han, Minhyung Hong, Seungyoung Kim, Jieun Lee, DongYoung Lee, Eungryong Oh, Ahlin Choi, Hyowon Park, Waley Liang, DongSub Choi, Nakyoon Kim, Jeongpyo Lee, Stilian Pandev, Sanghuck Jeon, John Robinson

Proceedings Volume 10585, 105851D (2018) https://doi.org/10.1117/12.2300946

KEYWORDS: Semiconducting wafers, Overlay metrology, Model-based design, Metrology, Diffractive optical elements, Etching, Process modeling, Process control, Optical imaging, Optical metrology

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Proceedings Article | 13 March 2018 Paper

Clean focus, dose and CD metrology for CD uniformity improvement

Honggoo Lee , Sangjun Han, Minhyung Hong, Seungyoung Kim, Jieun Lee, DongYoung Lee, Eungryong Oh, Ahlin Choi, Nakyoon Kim, John Robinson, Markus Mengel , Rovira Pablo , Sungchul Yoo, Raphael Getin, Dongsub Choi, Sanghuck Jeon

Proceedings Volume 10585, 105852A (2018) https://doi.org/10.1117/12.2299976

KEYWORDS: Semiconducting wafers, Metrology, Critical dimension metrology, Scanners, Process control, Modulation, Scatterometry, Finite element methods, Signal to noise ratio, Single crystal X-ray diffraction

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