Dr. Paul T. Konkola Profile

Dr. Paul T. Konkola

at Eyekon Systems LLC

SPIE Involvement:

Author

Publications (6)

Proceedings Article | 29 January 2004 Paper

Advances in reflection grating technology for Constellation-X

Ralf Heilmann, Mireille Akilian, Chih-Hao Chang, Carl Chen, Craig Forest, Chulmin Joo, Paul Konkola, Juan Montoya, Yanxia Sun, Jenny You, Mark Schattenburg

Proceedings Volume 5168, (2004) https://doi.org/10.1117/12.510258

KEYWORDS: Semiconducting wafers, Silicon, Etching, Diffraction gratings, Assembly tolerances, Optical fabrication, Optical lithography, Metrology, Nanoimprint lithography, Roentgenium

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Proceedings Article | 11 March 2003 Paper

Precision shaping, assembly, and metrology of foil optics for x-ray reflection gratings

Craig Forest, Mark Schattenburg, Carl Chen, Ralf Heilmann, Paul Konkola, JoHanna Przbylowski, Yanxia Sun, Jenny You, Steven Kahn, Donald Golini

Proceedings Volume 4851, (2003) https://doi.org/10.1117/12.461477

KEYWORDS: Metrology, Assembly tolerances, Wavefront sensors, Surface finishing, X-rays, Silicon, Reflection, Polishing, Semiconducting wafers, Sensors

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Proceedings Article | 13 November 2002 Paper

Nanometer-accurate grating fabrication with scanning beam interference lithography

Carl Chen, Paul Konkola, Ralf Heilmann, Chulmin Joo, Mark Schattenburg

Proceedings Volume 4936, (2002) https://doi.org/10.1117/12.469431

KEYWORDS: Interferometers, Metrology, Lithography, Optical alignment, Beam splitters, Mirrors, Heterodyning, Wavefront metrology, Interferometry, Signal processing

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Proceedings Article | 30 January 2002 Paper

Novel methods for shaping thin-foil optics for x-ray astronomy

Ralf Heilmann, Glen Monnelly, Olivier Mongrard, Nat Butler, Carl Chen, Lester Cohen, Christopher Cook, Lee Goldman, Paul Konkola, Michael McGuirk, George Ricker, Mark Schattenburg

Proceedings Volume 4496, (2002) https://doi.org/10.1117/12.454373

KEYWORDS: Glasses, Semiconducting wafers, Silicon, Particles, Epoxies, Coating, Reflection, Thin films, X-ray optics, Mirrors

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Proceedings Article | 30 January 2002 Paper

Progress toward a general grating patterning technology using phase-locked scanning beams

Mark Schattenburg, Carl Chen, Ralf Heilmann, Paul Konkola, G. Pati

Proceedings Volume 4485, (2002) https://doi.org/10.1117/12.454273

KEYWORDS: Interferometers, Lithography, Beam splitters, Diffraction gratings, Digital signal processing, Mirrors, Optics manufacturing, Signal processing, Optical lithography, Electron beam lithography

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Proceedings Article | 28 November 2000 Paper

High-accuracy x-ray foil optic assembly

Glen Monnelly, Olivier Mongrard, David Breslau, Nat Butler, Carl Chen, Lester Cohen, Wendy Gu, Ralf Heilmann, Paul Konkola, George Ricker, Mark Schattenburg

Proceedings Volume 4138, (2000) https://doi.org/10.1117/12.407556

KEYWORDS: Optical alignment, X-ray optics, Silicon, Assembly tolerances, Teeth, Tolerancing, Autocollimators, Mirrors, Metrology, Optical mounts

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Showing 5 of 6 publications

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