Prof. Ryszard J. Pryputniewicz Profile

Prof. Ryszard J. Pryputniewicz

Professor and Director at Worcester Polytechnic Institute

SPIE Involvement:

Track Chair | Author

Publications (49)

Proceedings Article | 10 October 2013 Paper

Nondestructive optical characterization of MEMS

Ryszard Pryputniewicz

Proceedings Volume 8916, 891602 (2013) https://doi.org/10.1117/12.2036620

KEYWORDS: Microelectromechanical systems, Glasses, Optoelectronics, Sensors, Gyroscopes, Interferometry, Optical inspection, Light emitting diodes, Nondestructive evaluation, Tuning fork gyroscopes

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SPIE Journal Paper | 1 October 2011

Recent advances in microdevices for transportation industry

Ryszard Pryputniewicz

OE, Vol. 50, Issue 10, 101508, (October 2011) https://doi.org/10.1117/12.10.1117/1.3605680

KEYWORDS: Microelectromechanical systems, Sensors, Optoelectronics, Fringe analysis, Optical engineering, Electronics, Finite element methods, Calibration, Microsystems, Computing systems

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Proceedings Article | 14 September 2010 Paper

Speckle metrology in the nanoworld, as it is perceived today, and how it may affect industry

Ryszard Pryputniewicz

Proceedings Volume 7387, 73870L (2010) https://doi.org/10.1117/12.877497

KEYWORDS: Microelectromechanical systems, Switches, Gyroscopes, Sensors, Optoelectronics, Computer simulations, Interferometry, Software development, Microscopes, Instrument modeling

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My memory goes back to my early collage studies that were almost entirely on the scale of "macroworld", as we practiced/perceived it some four decades ago. Since that time things have changed a lot constantly decreasing the scales of interest, at times at rather rapid pace, with monumental advances leading to the scales we work with today and plan for tomorrow. During that change/transition there were "meso" and "micro" developments characterized by changes in scales/sizes of things of interest. Today's scale of interest is "nano" and we are already not only working with "picotechnology", but are even reaching beyond while constantly "planning and projecting" the scales/worlds of the future. Advancement of any technology, especially new emerging ones as we witness/experience them today, is facilitated by the use of all available solution strategies. One of the emerging strategies that affect almost anything currently being developed and/or used, in the today's nanoworld, is based on recent advances of microelectromechanical systems (MEMS). Today MEMS affect almost everything we do from household appliances, via cars we drive and planes that whisk us from continent to continent, to spaceships used for search of/and exploration of other worlds. The modern microsensors are also used to explore for and produce petroleum products that are used in multitude of today's applications. To facilitate these advances a great majority of MEMS is used in the form of sensors. However development of MEMS in general and sensors in particular poses one of the greatest challenges in today's experimental mechanics. Among MEMS, the greatest contemporary interest is in the area of inertial sensors because they have numerous uses ranging from everyday applications to highly specialized ones, including many industrial platforms. As such they have tremendous potential to affect future of humanity. However, advances in MEMS, such as pressure and temperature sensors as well as gyroscopes and accelerometers, require the use of computational modeling and simulation coupled/combined with physical measurements. This author believes that successful combination of computer aided design (CAD) and multiphysics as well as multiscale simulation tools with the state-of-the-art (SOTA) measurement methodology will contribute to reduction of high prototyping costs, long product development cycles, and time-tomarket pressures while developing new sensors with nanoscale characteristics for various applications we use now and those that we will need in the future. In our approach we combine/hybridize a unique, fully integrated, software environment for multiscale, multiphysics, high fidelity analysis of the contemporary sensors with the SOTA optoelectronic laser interferometric microscope (OELIM) methodology, which is based on recent developments in speckle. The speckle-based OELIM methodology allows remote, noninvasive, full-field-of-view (FFV) measurements of deformations with high spatial resolution, nanometer accuracy, and in near real-time. In this paper, both, the software environment and the OELIM methodology are described and their applications are illustrated with representative examples demonstrating viability of the completely autonomous computer-based procedures for the development of contemporary sensors with nanocharacteristics suitable for the advancement of new evolving technologies that will shape our future. This process is demonstrated using devices of contemporary interest. The preliminary examples demonstrate capability of our approach to quantitatively determine effects of static and dynamic loads on the performance of sensors. In addition, potential economic rewards of the technology, projected into near future, will also be discussed.

Proceedings Article | 25 August 2009 Paper

Dynamic behavior of microstructures

Ryszard Pryputniewicz

Proceedings Volume 7375, 73750S (2009) https://doi.org/10.1117/12.839035

KEYWORDS: Microelectromechanical systems, Optoelectronics, Switches, Computer aided design, Microscopes, Computer simulations, CCD cameras, Interferometry, Fiber optics, Computing systems

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Proceedings Article | 3 October 2008 Paper

Precision optical metrology for MEMS

Ryszard Pryputniewicz

Proceedings Volume 7155, 71551S (2008) https://doi.org/10.1117/12.814565

KEYWORDS: Microelectromechanical systems, Optical metrology, Fringe analysis, Micromirrors, Metrology, CCD cameras, Switches, Reliability, Optoelectronics, Microscopes

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Proceedings Article | 18 February 2008 Paper

Development of nondestructive testing/evaluation methodology for MEMS

James Zunino, Donald Skelton, Ryan Marinis, Adam Klempner, Peter Hefti, Ryszard Pryputniewicz

Proceedings Volume 6884, 688407 (2008) https://doi.org/10.1117/12.759659

KEYWORDS: Microelectromechanical systems, Nondestructive evaluation, Optoelectronics, Fringe analysis, Reliability, Finite element methods, Switches, Fused deposition modeling, CCD cameras, Microscopes

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Proceedings Article | 18 June 2007 Paper

Advances in optoelectronic methodology for micro- and nano-scale measurements

Ryszard Pryputniewicz

Proceedings Volume 6616, 66162V (2007) https://doi.org/10.1117/12.732042

KEYWORDS: Microelectromechanical systems, Fringe analysis, Optoelectronics, Sensors, Micromirrors, Finite element methods, Switches, Fused deposition modeling, Microscopes, CCD cameras

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Proceedings Article | 19 January 2007 Paper

Hybrid approach to MEMS reliability assessment

James Zunino, Donald Skelton, Wei Han, Ryszard Pryputniewicz

Proceedings Volume 6463, 646304 (2007) https://doi.org/10.1117/12.700697

KEYWORDS: Microelectromechanical systems, Reliability, Switches, Sensors, Packaging, Optoelectronics, Microscopes, CCD cameras, Fringe analysis, Nanolithography

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Proceedings Article | 7 March 2006 Paper

Hybrid optical-computational methodology for studies and optimization of microelectronic components

Cosme Furlong, Ryszard Pryputniewicz

Proceedings Volume 4101, (2006) https://doi.org/10.1117/12.498385

KEYWORDS: Resistors, Electronic components, Microelectronics, Nondestructive evaluation, Image processing, Hybrid optics, Packaging, Holography, Signal processing, Directional couplers

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Proceedings Article | 7 March 2006 Paper

Characterization of MEMS microgears rotating up to 360,000 rpm by stroboscopic optoelectronic laser interferometry microscope (SOELIM) methodology

Gordon Brown, Ryszard Pryputniewicz, Maarten DeBoer, Samuel Miller

Proceedings Volume 4101, (2006) https://doi.org/10.1117/12.498383

KEYWORDS: Microelectromechanical systems, Laser interferometry, Beam splitters, Microscopes, Optoelectronics, Bragg cells, Mirrors, Interferometry, Image processing, Tolerancing

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Proceedings Article | 7 March 2006 Paper

Minimization of systematic errors in phase-shifting interferometry: evaluation of residuals

Parameswaran Hariharan, Emily Pryputniewicz, Ryszard Pryputniewicz

Proceedings Volume 4101, (2006) https://doi.org/10.1117/12.498384

KEYWORDS: Phase shifts, Phase interferometry, Algorithm development, Ferroelectric materials, Optical testing, Photodetectors, Spatial frequencies, Error analysis, Laser interferometry, Optical spheres

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Proceedings Article | 29 September 2004 Paper

Investigations of laser percussion drilling of small holes on thin sheet metals

Wei Han, Ryszard Pryputniewicz

Proceedings Volume 5525, (2004) https://doi.org/10.1117/12.560253

KEYWORDS: Laser drilling, Pulsed laser operation, Metals, Laser processing, Liquids, Plasma, Laser energy, Nd:YAG lasers, Absorption, Reflectivity

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Proceedings Article | 2 August 2004 Paper

Study and characterization of a MEMS micromirror device

Cosme Furlong, Ryszard Pryputniewicz

Proceedings Volume 5531, (2004) https://doi.org/10.1117/12.562894

KEYWORDS: Microelectromechanical systems, Micromirrors, Reflectivity, Beam splitters, Holography, Microopto electromechanical systems, Sensors, Optoelectronics, Actuators, Finite element methods

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Proceedings Article | 2 August 2004 Paper

Nondestructive evaluations of thermal deformations for laser microwelding process

Wei Han, Ryszard Pryputniewicz

Proceedings Volume 5532, (2004) https://doi.org/10.1117/12.560273

KEYWORDS: Laser processing, Fringe analysis, Nondestructive evaluation, Holography, Laser development, Laser applications, Optoelectronics, Image processing, Laser welding, Laser energy

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SPIE Journal Paper | 1 May 2003

Optoelectronic characterization of shape and deformation of MEMS accelerometers used in transportation applications

Cosme Furlong, Ryszard Pryputniewicz

OE, Vol. 42, Issue 05, (May 2003) https://doi.org/10.1117/12.10.1117/1.1566776

KEYWORDS: Microelectromechanical systems, Optoelectronics, Sensors, Computer aided design, Clouds, Holography, Optical engineering, Electromechanical design, Shape analysis, Finite element methods

Proceedings Article | 21 January 2003 Paper

Novel optoelectronic methodology for testing MOEMS

Ryszard Pryputniewicz, Cosme Furlong

Proceedings Volume 4983, (2003) https://doi.org/10.1117/12.480763

KEYWORDS: Micromirrors, Microopto electromechanical systems, Optoelectronics, Microelectromechanical systems, Microsystems, Optical fibers, Fiber optics, CCD cameras, Beam splitters, Fringe analysis

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Proceedings Article | 20 June 2002 Paper

Sensitivity, accuracy, and precision issues in opto-electronic holography based on fiber optics and high-spatial- and high-digitial-resolution cameras

Cosme Furlong, Jeffrey Yokum, Ryszard Pryputniewicz

Proceedings Volume 4777, (2002) https://doi.org/10.1117/12.472206

KEYWORDS: Imaging systems, Optical metrology, Holography, Cameras, Image processing, Speckle, Optoelectronics, Fiber optics, Speckle pattern, Calibration

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Proceedings Article | 20 June 2002 Paper

Speckle noise reduction in quantitative optical metrology techniques by application of the discrete wavelet transformation

Cosme Furlong, Ryszard Pryputniewicz

Proceedings Volume 4777, (2002) https://doi.org/10.1117/12.472228

KEYWORDS: Speckle, Wavelets, Denoising, Interferometry, Discrete wavelet transforms, Image processing, CCD cameras, Optical metrology, Phase shift keying, Holography

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Proceedings Article | 19 June 2002 Paper

Characterization of shape and deformation of MEMS by quantitative optoelectronic metrology techniques

Cosme Furlong, Ryszard Pryputniewicz

Proceedings Volume 4778, (2002) https://doi.org/10.1117/12.473551

KEYWORDS: Microelectromechanical systems, Optoelectronics, Computer aided design, Sensors, Metrology, Interferometry, Beam splitters, Holography, Electromechanical design, Reliability

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SPIE Journal Paper | 1 January 2000

New test methodology for static and dynamic shape measurement of MEMS

Gordon Brown, Ryszard Pryputniewicz

OE, Vol. 39, Issue 01, (January 2000) https://doi.org/10.1117/12.10.1117/1.602353

KEYWORDS: Microelectromechanical systems, Sensors, Tolerancing, Manufacturing, Microscopes, Optical engineering, Interferometry, Beam splitters, Actuators, Optoelectronics

SPIE Journal Paper | 1 January 2000

Absolute shape measurements using high-resolution optoelectronic holography methods

Cosme Furlong, Ryszard Pryputniewicz

OE, Vol. 39, Issue 01, (January 2000) https://doi.org/10.1117/12.10.1117/1.602355

KEYWORDS: Imaging systems, Speckle, Calibration, Computer aided design, Shape analysis, Cameras, CCD cameras, Ferroelectric materials, Speckle pattern, Holography

Proceedings Article | 30 June 1998 Paper

Electro-optic holography method for determination of surface shape and deformation

Cosme Furlong, Ryszard Pryputniewicz

Proceedings Volume 3478, (1998) https://doi.org/10.1117/12.312969

KEYWORDS: Cameras, Semiconductor lasers, Imaging systems, Holography, Fiber optics, Directional couplers, Electro optics, Computer aided design, Video, Single mode fibers

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SPIE Journal Paper | 1 May 1998

Holographic microscope for measuring displacements of vibrating microbeams using time-averaged, electro-optic holography

Gordon Brown, Ryszard Pryputniewicz

OE, Vol. 37, Issue 05, (May 1998) https://doi.org/10.1117/12.10.1117/1.601654

KEYWORDS: Holography, Microscopes, Microelectromechanical systems, Atomic force microscopy, Sensors, Finite element methods, Electro optics, Holographic interferometry, Holograms, Modulation

SPIE Journal Paper | 1 May 1998

Hybrid computational and experimental approach for the study and optimization of mechanical components

Cosme Furlong, Ryszard Pryputniewicz

OE, Vol. 37, Issue 05, (May 1998) https://doi.org/10.1117/12.10.1117/1.601679

KEYWORDS: Optimization (mathematics), Image processing, Chemical elements, Electro optical modeling, Video, CCD cameras, Fiber optics, Optical components, Modulation, Optical engineering

Proceedings Article | 18 September 1996 Paper

Micromeasurements: a challenge for photomechanics

Malgorzata Kujawinska, Ryszard Pryputniewicz

Proceedings Volume 2782, (1996) https://doi.org/10.1117/12.250743

KEYWORDS: Microelectromechanical systems, Computing systems, Holography, Interferometry

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Proceedings Article | 19 July 1996 Paper

Electro-optic interferometry for study of carbon deposition on transition metal surfaces: preliminary results

Hans van Dongeren, Ryszard Pryputniewicz, Albert Sacco

Proceedings Volume 2861, (1996) https://doi.org/10.1117/12.245166

KEYWORDS: Carbon, Cobalt, Speckle, Interferometry, Metals, Electro optics, Transition metals, Scanning electron microscopy, Photomicroscopy, Speckle pattern

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Proceedings Article | 19 July 1996 Paper

Hybrid, experimental and computational, investigation of mechanical components

Cosme Furlong, Ryszard Pryputniewicz

Proceedings Volume 2861, (1996) https://doi.org/10.1117/12.245159

KEYWORDS: Chemical elements, Image processing, Beam splitters, Optimization (mathematics), Video, Electro optical modeling, CCD cameras, Holography, Modulation, Semiconductor lasers

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Proceedings Article | 17 July 1996 Paper

Holographic microscope for measuring displacements of vibrating microbeams using time-average holography

Gordon Brown, Ryszard Pryputniewicz

Proceedings Volume 2860, (1996) https://doi.org/10.1117/12.276296

KEYWORDS: Microelectromechanical systems, Microscopes, Holography, Atomic force microscopy, Fringe analysis, Finite element methods, Sensors, Holographic interferometry, Holograms, Modulation

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Proceedings Article | 23 June 1995 Paper

Experimental and computational determination of dynamic characteristics of microbeam sensors

Gordon Brown, Ryszard Pryputniewicz

Proceedings Volume 2545, (1995) https://doi.org/10.1117/12.212636

KEYWORDS: Finite element methods, Microelectromechanical systems, Sensors, Holography, Manufacturing, Signal detection, Data modeling, Actuators, Measurement devices, Electro optics

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Proceedings Article | 23 June 1995 Paper

ESPI-FEM hybrid system for studies of time-dependent stress characteristics in small components

Artur Olszak, Ryszard Pryputniewicz

Proceedings Volume 2545, (1995) https://doi.org/10.1117/12.212669

KEYWORDS: Finite element methods, Phase shift keying, Speckle, Interferometry, Semiconductor lasers, Computing systems, Modulation, Data modeling, Image processing, Phase shifts

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Proceedings Article | 23 June 1995 Paper

Computational and experimental hybrid study of deformations in a microelectronic connector

Malgorzata Kujawinska, Tomasz Tkaczyk, Ryszard Pryputniewicz

Proceedings Volume 2545, (1995) https://doi.org/10.1117/12.212670

KEYWORDS: Connectors, Microelectronics, Finite element methods, Interferometry, Computing systems, Interferometers, Packaging, Phase shifting, Diffraction gratings, Fringe analysis

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Proceedings Article | 23 June 1995 Paper

Optomechanical study and optimization of cantilever plate dynamics

Cosme Furlong, Ryszard Pryputniewicz

Proceedings Volume 2545, (1995) https://doi.org/10.1117/12.212647

KEYWORDS: Optimization (mathematics), Finite element methods, Modal analysis, Electro optical modeling, Computer programming, Beam splitters, Holography, Shape analysis, Fringe analysis, Holographic interferometry

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Proceedings Article | 23 June 1995 Paper

Hologram interferometry from silver halide to silicon and--beyond

Ryszard Pryputniewicz

Proceedings Volume 2545, (1995) https://doi.org/10.1117/12.212857

KEYWORDS: Holograms, Interferometry, Holographic interferometry, Fringe analysis, Holography, 3D image reconstruction, Finite element methods, Modulation, Silicon, Silver

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Proceedings Article | 23 June 1995 Paper

Quantitative EOH and FEM hybrid study of vibration characteristics of avionics

Chris Leak, Ryszard Pryputniewicz

Proceedings Volume 2545, (1995) https://doi.org/10.1117/12.212658

KEYWORDS: Holograms, Finite element methods, Holography, Electro optics, Holographic interferometry, Interferometry, Fringe analysis, Bessel functions, Modulation, CCD cameras

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Proceedings Article | 14 June 1995 Paper

New optomechanical approach to quantitative characterization of fatigue behavior of dynamically loaded structures

Cosme Furlong, Ryszard Pryputniewicz

Proceedings Volume 2544, (1995) https://doi.org/10.1117/12.211887

KEYWORDS: Chemical elements, Finite element methods, Vibrometry, Holography, Electro optics, Modal analysis, Beam splitters, Interferometers, Signal detection, Data modeling

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Proceedings Article | 30 November 1994 Paper

Hybrid approach to deformation analysis

Ryszard Pryputniewicz

Proceedings Volume 2342, (1994) https://doi.org/10.1117/12.195516

KEYWORDS: Chemical elements, Finite element methods, Holograms, Holography, Holographic interferometry, Interferometry, Error analysis, 3D image reconstruction, Fringe analysis, Modulation

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Proceedings Article | 1 March 1994 Paper

Measurement of Young's modulus on thin films under static and dynamic loading conditions

Gordon Brown, Ryszard Pryputniewicz

Proceedings Volume 2004, (1994) https://doi.org/10.1117/12.172604

KEYWORDS: Thin films, Finite element methods, Vibrometry, Interferometry, Holography, Electro optics, Aluminum, Uncertainty analysis, Beam shaping, Error analysis

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Proceedings Article | 10 December 1993 Paper

Phase unwrapping by least squares error minimization of phase curvature

Thomas Bushman, Michael Gennert, Ryszard Pryputniewicz

Proceedings Volume 2003, (1993) https://doi.org/10.1117/12.165468

KEYWORDS: Holograms, Image processing, Cameras, Modulation, Interferometry, Speckle, Data modeling, Wavefronts, Holography, Phase shift keying

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Proceedings Article | 1 June 1993 Paper

Electro-optic holography

Ryszard Pryputniewicz

Proceedings Volume 10268, 1026808 (1993) https://doi.org/10.1117/12.170181

KEYWORDS: Electro optics, Holography

Proceedings Article | 28 May 1993 Paper

Electronic shearography and electronic holography working side by side

Ryszard Pryputniewicz

Proceedings Volume 1821, (1993) https://doi.org/10.1117/12.145570

KEYWORDS: Holography, Shearography, Holograms, Mirrors, Interferometry, Speckle pattern, CCD cameras, Cameras, Image processing, Estimation theory

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Proceedings Article | 28 May 1993 Paper

Investigation of a submillimeter cantilever beam of variable cross section by computational and hologram interferometry methods

Gordon Brown, Ryszard Pryputniewicz

Proceedings Volume 1821, (1993) https://doi.org/10.1117/12.145571

KEYWORDS: Holograms, Holographic interferometry, Interferometry, Finite element methods, Heterodyning, Holography, Fringe analysis, Beam shaping, Phase shift keying, Microscopes

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Proceedings Article | 28 May 1993 Paper

Holographic and computational study of coupled vibrations of channel beams

Michael Klausbruckner, Ryszard Pryputniewicz

Proceedings Volume 1821, (1993) https://doi.org/10.1117/12.145575

KEYWORDS: Holograms, Holographic interferometry, Holography, Finite element methods, Interferometry, Heterodyning, Fringe analysis, Beam shaping, Chemical elements, 3D image reconstruction

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Proceedings Article | 15 February 1993 Paper

Holographic study of vibrations of a wing section

Scott Biederman, Ryszard Pryputniewicz

Proceedings Volume 1756, (1993) https://doi.org/10.1117/12.140796

KEYWORDS: Holograms, Holography, Interferometry, Holographic interferometry, Electro optical modeling, Finite element methods, Laser interferometry, Heterodyning, Electro optics, Phase measurement

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Proceedings Article | 15 February 1993 Paper

Numerical and experimental study of wave propagation in metals

Brian Cranton, Ryszard Pryputniewicz

Proceedings Volume 1756, (1993) https://doi.org/10.1117/12.140797

KEYWORDS: Wave propagation, Aluminum, Holography, Wavefronts, Metals, Laser beam propagation, Modal analysis, Analytical research, Ruby lasers, Interferometry

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Proceedings Article | 15 February 1993 Paper

Nanomeasurements by heterodyne hologram interferometry

Gordon Brown, Ryszard Pryputniewicz

Proceedings Volume 1756, (1993) https://doi.org/10.1117/12.140810

KEYWORDS: Holograms, Heterodyning, Interferometry, Electronics, Holographic interferometry, Electronic components, 3D image reconstruction, Fiber optics, Phase measurement, Phase shift keying

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Proceedings Article | 5 February 1993 Paper

Three-dimensional graphics techniques applied to the rendering of holographic interferometric data

Thomas Bushman, Ryszard Pryputniewicz

Proceedings Volume 1755, (1993) https://doi.org/10.1117/12.140785

KEYWORDS: 3D modeling, Holograms, Data modeling, Eye, Holography, Light sources, Computing systems, Visualization, Electro optical modeling, Holographic interferometry

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Proceedings Article | 5 February 1993 Paper

Investigation of submillimeter components by heterodyne holographic interferometry and computational methods

Gordon Brown, Ryszard Pryputniewicz

Proceedings Volume 1755, (1993) https://doi.org/10.1117/12.140760

KEYWORDS: Heterodyning, Holography, Holograms, Holographic interferometry, Microscopes, Finite element methods, Phase measurement, Interferometry, Chemical elements, 3D image reconstruction

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Proceedings Article | 1 August 1992 Paper

Quantitative holographic studies in biomedicine

Ryszard Pryputniewicz

Proceedings Volume 1647, (1992) https://doi.org/10.1117/12.60216

KEYWORDS: Holograms, Heterodyning, Bone, Holography, Holographic interferometry, 3D image reconstruction, Fiber optics, Interferometry, Skull, Fringe analysis

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Proceedings Article | 1 December 1991 Paper

Static and dynamic measurements using electro-optic holography

Ryszard Pryputniewicz

Proceedings Volume 1554, (1991) https://doi.org/10.1117/12.57475

KEYWORDS: Holograms, Holographic interferometry, Image processing, Holography, Mechanics, Electro optics, Image storage, Modulation, Interferometry, CCD cameras

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Showing 5 of 49 publications

Proceedings Volume Editor (16)

SPIE Conference Volume | 7 July 2000

Laser Interferometry X: Techniques and Analysis

SPIE Conference Volume | 7 July 2000

Laser Interferometry X: Techniques and Analysis

SPIE Conference Volume | 6 July 1998

Laser Interferometry IX: Applications

SPIE Conference Volume | 19 July 1996

Laser Interferometry VIII: Applications

SPIE Conference Volume | 17 July 1996

Laser Interferometry VIII: Techniques and Analysis

Showing 5 of 16 publications

Conference Committee Involvement (23)

Interferometry XVII: Advanced Applications

19 August 2014 | San Diego, California, United States

Optical Measurement Systems for Industrial Inspection VIII

13 May 2013 | Munich, Germany

Interferometry XVI: Applications

14 August 2012 | San Diego, California, United States

Interferometry XV: Applications

3 August 2010 | San Diego, California, United States

Optical Measurement Systems for Industrial Inspection IV

13 June 2005 | Munich, Germany

MOEMS and Miniaturized Systems V

25 January 2005 | San Jose, California, United States

MOEMS and Miniaturized Systems IV

27 January 2004 | San Jose, California, United States

Laser Interferometry X: Applications

2 August 2000 | San Diego, CA, United States

Laser Interferometry X: Techniques and Analysis

31 July 2000 | San Diego, CA, United States

Laser Interferometry IX: Applications

22 July 1998 | San Diego, CA, United States

Laser Interferometry VIII: Applications

8 August 1996 | Denver, CO, United States

Laser Interferometry VIII: Techniques and Analysis

6 August 1996 | Denver, CO, United States

Interferometry VII: Applications

13 July 1995 | San Diego, CA, United States

Interferometry VII: Techniques and Analysis

11 July 1995 | San Diego, CA, United States

Interferometry '94: Photomechanics

16 May 1994 | Warsaw, Poland

Interferometry VI: Applications

14 July 1993 | San Diego, CA, United States

Interferometry: Applications

22 July 1992 | San Diego, CA, United States

Laser Interferometry IV: Computer-Aided Interferometry

22 July 1991 | San Diego, CA, United States

Laser Interferometry: Quantitative Analysis of Interferograms: Third in a Series

7 August 1989 | San Diego, United States

Industrial Laser Interferometry II

27 June 1988 | Dearborn, MI, United States

Industrial Laser Interferometry

12 January 1987 | Los Angeles, CA, United States

Holography Applications

2 July 1986 | Beijing, China

Laser and Opto-Electronic Technology in Industry: State-of-the-Art Review

25 June 1986 | Xiamen, China

Showing 5 of 23 Conference Committees

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