Dr. Yongchan Ban
Sr. Director of Engineering
SPIE Involvement:
Author
Profile Summary

Yongchan (James) Ban received his Ph.D. degree in electrical and computer engineering at the University of Texas at Austin. He is a director of engineering at Synopsys R&D and leads multiple advanced node foundry technologies. He worked for Samsung electronics, Intel Corporation, LG Electronics, and Globalfoundries. He has breadth and depth of expertise from semiconductor technology to VLSI physical implementation. His current research areas are on physical design flow and methodology, and DTCO (design technology co-optimization).
Publications (17)

Proceedings Article | 10 April 2024 Presentation + Paper
Proceedings Volume 12954, 129540B (2024) https://doi.org/10.1117/12.3010937
KEYWORDS: Metals, Machine learning, Design, Back end of line, Modeling, System on a chip, Semiconductors, Evolutionary optimization, Electronic design automation, Design rules

Proceedings Article | 28 April 2023 Presentation + Paper
Proceedings Volume 12495, 124951A (2023) https://doi.org/10.1117/12.2658070
KEYWORDS: Metals, Machine learning, Design rules, Electronic design automation, Reproducibility, Logic, Transistors, System on a chip, Semiconductors, Fabrication

Proceedings Article | 28 March 2017 Paper
Proceedings Volume 10148, 1014810 (2017) https://doi.org/10.1117/12.2258340
KEYWORDS: Design for manufacturing, Power supplies, Integrated circuit design, Electronic design automation, Transistors, Logic, Switching, Inductance, Reliability, Resistance, Capacitance, Metals

Proceedings Article | 16 March 2016 Paper
Yongchan Ban, Sang Min Han, Eunjoo Choi, Tamba Gbondo-Tugbawa, Kuang Han Chen
Proceedings Volume 9781, 97810G (2016) https://doi.org/10.1117/12.2219118
KEYWORDS: Chemical mechanical planarization, Model-based design, Design for manufacturing, Etching, Design for manufacturability, Manufacturing, Metals, Copper, Capacitance, Resistance, Semiconducting wafers, Oxides

SPIE Journal Paper | 4 December 2014
JM3, Vol. 14, Issue 01, 011004, (December 2014) https://doi.org/10.1117/12.10.1117/1.JMM.14.1.011004
KEYWORDS: Photomasks, Metals, Lithography, Optical lithography, Double patterning technology, Semiconducting wafers, Manufacturing, Logic, Optical proximity correction, Lithographic illumination

Showing 5 of 17 publications
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