Dr. Sen Zhou
at Chongqing Institute of Metrology and Quality Inspection
SPIE Involvement:
Author
Publications (26)

Proceedings Article | 20 November 2024 Poster + Paper
Proceedings Volume 13242, 132422C (2024) https://doi.org/10.1117/12.3037032
KEYWORDS: Phosphorescence, Carbon dots, Fluorescence, Design, Quantum particles, Particles, Environmental monitoring, Carbon, Cadmium sulfide, Quantum experiments

Proceedings Article | 20 November 2024 Paper
Proceedings Volume 13241, 132410R (2024) https://doi.org/10.1117/12.3037029
KEYWORDS: Computed tomography, Manufacturing, Metrology, 3D metrology, X-ray computed tomography, Computing systems, X-rays, X-ray imaging, Measurement uncertainty, Calibration

Proceedings Article | 28 May 2024 Poster + Paper
Proceedings Volume 13083, 1308316 (2024) https://doi.org/10.1117/12.3019560
KEYWORDS: 3D metrology, Teeth, 3D modeling, Laser scanners, Manufacturing, Metrology, Inspection, Data modeling, Beam path, Point clouds

Proceedings Article | 28 May 2024 Poster + Paper
Proceedings Volume 13083, 1308315 (2024) https://doi.org/10.1117/12.3018671
KEYWORDS: Sensors, Calibration, Sensor calibration, Control systems, Microelectromechanical systems, Metrology, Autocollimators, Accelerometers, Resistance, Optical gratings

Proceedings Article | 27 November 2023 Paper
Proceedings Volume 12769, 127690J (2023) https://doi.org/10.1117/12.2684550
KEYWORDS: Teeth, 3D metrology, Laser scanners, Manufacturing, Beam path, Metrology, Inspection, 3D modeling, Industry, Data processing

Showing 5 of 26 publications
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