Vinay Pai
at IBM Research - Albany
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 10 April 2024 Presentation
Proceedings Volume PC12956, PC129560E (2024) https://doi.org/10.1117/12.3012541
KEYWORDS: Optical lithography, Lithography, Coating thickness, Semiconducting wafers, Plating, Photoresist processing, Dielectrics, Coating

Proceedings Article | 22 February 2021 Presentation + Paper
Proceedings Volume 11615, 116150J (2021) https://doi.org/10.1117/12.2583645
KEYWORDS: Analytics, Data processing, Sensors, Semiconducting wafers, Process control, Manufacturing, Time metrology, Statistical analysis, Semiconductor manufacturing, Metrology

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