PROCEEDINGS VOLUME 4777
INTERNATIONAL SYMPOSIUM ON OPTICAL SCIENCE AND TECHNOLOGY | 7-11 JULY 2002
Interferometry XI: Techniques and Analysis
INTERNATIONAL SYMPOSIUM ON OPTICAL SCIENCE AND TECHNOLOGY
7-11 July 2002
Seattle, WA, United States
Microscopy and Image Formation
Proc. SPIE 4777, Quantitative Zernike phase-contrast microscopy by use of structured birefringent pupil-filters and phase-shift evaluation, 0000 (20 June 2002); doi: 10.1117/12.472223
New Approaches
Proc. SPIE 4777, Task-based assessment of phase-shifting interferometer/ellipsometer, 0000 (20 June 2002); doi: 10.1117/12.472240
Proc. SPIE 4777, Histogram equalization of Young's fringes in speckle photography, 0000 (20 June 2002); doi: 10.1117/12.472246
Proc. SPIE 4777, Interferometer design for writing Bragg gratings in optical fibers, 0000 (20 June 2002); doi: 10.1117/12.472247
Proc. SPIE 4777, Technique for surface reconstruction using colored fringe patterns, 0000 (20 June 2002); doi: 10.1117/12.472248
Proc. SPIE 4777, Coaxial type of self-mixing interferometer equipped with a wavelength stabilizing system, 0000 (20 June 2002); doi: 10.1117/12.472249
Digital Holography
Proc. SPIE 4777, Digital complex holography using a shearing interferometer: principles and early results, 0000 (20 June 2002); doi: 10.1117/12.472204
Proc. SPIE 4777, Aperture synthesis in digital holography, 0000 (20 June 2002); doi: 10.1117/12.472205
Proc. SPIE 4777, Sensitivity, accuracy, and precision issues in opto-electronic holography based on fiber optics and high-spatial- and high-digitial-resolution cameras, 0000 (20 June 2002); doi: 10.1117/12.472206
Proc. SPIE 4777, Quasi-real-time digital holographic interferometry, 0000 (20 June 2002); doi: 10.1117/12.472207
Coherence Scanning Techniques
Proc. SPIE 4777, White-light interferometry via an endoscope, 0000 (20 June 2002); doi: 10.1117/12.472208
Proc. SPIE 4777, White-light interferometry with reference signal, 0000 (20 June 2002); doi: 10.1117/12.472209
Proc. SPIE 4777, Synthetic spatial coherence function for optical tomography and profilometry: simultaneous realization of longitudinal coherence scan and phase shift, 0000 (20 June 2002); doi: 10.1117/12.472210
Proc. SPIE 4777, Challenges in white-light phase-shifting interferometry, 0000 (20 June 2002); doi: 10.1117/12.472211
Proc. SPIE 4777, Compensation for phase change on reflection in white-light scanning interferometry, 0000 (20 June 2002); doi: 10.1117/12.472212
Proc. SPIE 4777, Digital demodulation algorithm for white-light fiber optic interferometric sensors, 0000 (20 June 2002); doi: 10.1117/12.472213
On the Fringe
Proc. SPIE 4777, High-precision optical metrology system for the SMART-2 mission as precursor for the DARWIN satellite constellation, 0000 (20 June 2002); doi: 10.1117/12.472214
Proc. SPIE 4777, Advances in digital speckle radiography, 0000 (20 June 2002); doi: 10.1117/12.472215
Proc. SPIE 4777, Numerical phase front propagation for the laser interferometer space antenna, 0000 (20 June 2002); doi: 10.1117/12.472216
Wavelength-Dependent Techniques
Proc. SPIE 4777, Optical thickness measurement of substrates using a transmitted wavefront test at two wavelengths to average out multiple reflection errors, 0000 (20 June 2002); doi: 10.1117/12.472217
Proc. SPIE 4777, Three-dimensional step-height measurement using Mirau-type spectral interference microscope with acousto-optic tunable filter as frequency scanning device, 0000 (20 June 2002); doi: 10.1117/12.472218
Proc. SPIE 4777, Three-lambda metrology, 0000 (20 June 2002); doi: 10.1117/12.472219
Proc. SPIE 4777, Twin-rainbow metrology, 0000 (20 June 2002); doi: 10.1117/12.472220
Proc. SPIE 4777, Improved algorithms for wavelength scanning interferometry: application to the simultaneous measurement of surface topography and optical thickness variation in a transparent parallel plate, 0000 (20 June 2002); doi: 10.1117/12.472221
Industrial Process Control
Proc. SPIE 4777, Some metrological issues in optical full-field techniques, 0000 (20 June 2002); doi: 10.1117/12.472222
Proc. SPIE 4777, CMOS-ESPI system with in-line digital phase stabilization using unresolved speckles, 0000 (20 June 2002); doi: 10.1117/12.472224
Proc. SPIE 4777, Scaled multisensor inspection of extended surfaces for industrial quality control, 0000 (20 June 2002); doi: 10.1117/12.472225
Proc. SPIE 4777, New adaptive phase-shifting algorithm for temporal phase evaluation, 0000 (20 June 2002); doi: 10.1117/12.472226
Noise Reduction and Phase Unwrapping
Proc. SPIE 4777, Noncontinuous fringe pattern demodulation using a digital phase-locked loop algorithm, 0000 (20 June 2002); doi: 10.1117/12.472227
Proc. SPIE 4777, Speckle noise reduction in quantitative optical metrology techniques by application of the discrete wavelet transformation, 0000 (20 June 2002); doi: 10.1117/12.472228
Proc. SPIE 4777, Evaluation of the continuous wavelet transform method for phase measurement in digital speckle pattern interferometry, 0000 (20 June 2002); doi: 10.1117/12.472229
Proc. SPIE 4777, Phase unwrapping of subsampled phase-shifted interferograms, 0000 (20 June 2002); doi: 10.1117/12.472230
Proc. SPIE 4777, Improved hybrid phase unwrapping algorithm in speckle interferometry, 0000 (20 June 2002); doi: 10.1117/12.472231
Joint Session: Subwavelength Metrology I
Proc. SPIE 4777, In-line optical surface roughness determination by laser scanning, 0000 (20 June 2002); doi: 10.1117/12.472232
Proc. SPIE 4777, Inspection of sub-wavelength structures and zero-order gratings using polarization interferometry, 0000 (20 June 2002); doi: 10.1117/12.472233
Joint Session: Subwavelength Metrology II
Proc. SPIE 4777, High-resolution surface feature evaluation using multiwavelength optical transforms, 0000 (20 June 2002); doi: 10.1117/12.472234
Proc. SPIE 4777, Alternating grazing incidence dark-field scanning optical microscopy for dimensional measurements, 0000 (20 June 2002); doi: 10.1117/12.472235
Proc. SPIE 4777, Polarization-dependent effects on phase singularities in the vicinity of sub-lambda structures, 0000 (20 June 2002); doi: 10.1117/12.472236
Poster Session
Proc. SPIE 4777, Optical processing for the detection of faults in interferometric patterns, 0000 (20 June 2002); doi: 10.1117/12.472237
Proc. SPIE 4777, Correlative stitching interferometer and its key techniques, 0000 (20 June 2002); doi: 10.1117/12.472238
Proc. SPIE 4777, Fiber optic diffraction interferometer for testing spherical mirrors, 0000 (20 June 2002); doi: 10.1117/12.472239
Proc. SPIE 4777, Super-heterodyning phase measurement for heterodyne interferometry, 0000 (20 June 2002); doi: 10.1117/12.472241
Proc. SPIE 4777, Novel C/T technique in LDA System, 0000 (20 June 2002); doi: 10.1117/12.472242
Proc. SPIE 4777, Novel heterometer for measuring surface roughness, 0000 (20 June 2002); doi: 10.1117/12.472243
Proc. SPIE 4777, Interferometric method to characterize thermal elongation of near-field optics probes, 0000 (20 June 2002); doi: 10.1117/12.472244
Noise Reduction and Phase Unwrapping
Proc. SPIE 4777, Interferometer for testing in vibration environments, 0000 (20 June 2002); doi: 10.1117/12.472245
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